dc.contributor.author | Schallerer, J. W. | en_US |
dc.date.accessioned | 2009-06-15T19:40:29Z | |
dc.date.available | 2009-06-15T19:40:29Z | |
dc.date.issued | 1955-04-11 | en_US |
dc.identifier | MC665_r15_M-3526 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.3/40614 | |
dc.description | Includes: introduction, test procedure, results, and conclusions. | en_US |
dc.description.abstract | Recent innovations in memory plane unit assembly made it desirable to install the Z and sense windings before the X-Y
test could be performed. Sixteen unit planes were assembled and tested in different sequences in order to determine which assembly and testing sequence was most efficient. The test results while not conclusive did seem to indicate that an intermediate
X-Y test were not necessary when the cores were subjected to a second production test previous to assembly. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Lincoln Laboratory - Division 6 | en_US |
dc.relation.ispartofseries | Division 6 Memo M-3526 | en_US |
dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
dc.subject.other | single-tested cores | en_US |
dc.subject.other | double-tested cores | en_US |
dc.subject.other | core outputs | en_US |
dc.subject.other | core breakage | en_US |
dc.title | X-Y tests on memory plane units | en_US |
dc.type | Technical Report | en_US |