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dc.contributor.authorSchallerer, J. W.en_US
dc.date.accessioned2009-06-15T19:40:29Z
dc.date.available2009-06-15T19:40:29Z
dc.date.issued1955-04-11en_US
dc.identifierMC665_r15_M-3526en_US
dc.identifier.urihttp://hdl.handle.net/1721.3/40614
dc.descriptionIncludes: introduction, test procedure, results, and conclusions.en_US
dc.description.abstractRecent innovations in memory plane unit assembly made it desirable to install the Z and sense windings before the X-Y test could be performed. Sixteen unit planes were assembled and tested in different sequences in order to determine which assembly and testing sequence was most efficient. The test results while not conclusive did seem to indicate that an intermediate X-Y test were not necessary when the cores were subjected to a second production test previous to assembly.en_US
dc.language.isoenen_US
dc.publisherLincoln Laboratory - Division 6en_US
dc.relation.ispartofseriesDivision 6 Memo M-3526en_US
dc.relation.ispartofseriesProject Whirlwind Collection, MC665en_US
dc.subject.othersingle-tested coresen_US
dc.subject.otherdouble-tested coresen_US
dc.subject.othercore outputsen_US
dc.subject.othercore breakageen_US
dc.titleX-Y tests on memory plane unitsen_US
dc.typeTechnical Reporten_US


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