MIT Libraries logoDome

MIT
View Item 
  • Dome Home
  • Project Whirlwind
  • Project Whirlwind Reports
  • View Item
  • Dome Home
  • Project Whirlwind
  • Project Whirlwind Reports
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

X-Y tests on memory plane units

Schallerer, J. W.
Thumbnail
DownloadMC665_r15_M-3526.pdf (661.3Kb)
URI
http://hdl.handle.net/1721.3/40614
Date
1955-04-11
Abstract
Recent innovations in memory plane unit assembly made it desirable to install the Z and sense windings before the X-Y test could be performed. Sixteen unit planes were assembled and tested in different sequences in order to determine which assembly and testing sequence was most efficient. The test results while not conclusive did seem to indicate that an intermediate X-Y test were not necessary when the cores were subjected to a second production test previous to assembly.
Description
Includes: introduction, test procedure, results, and conclusions.
Metadata
Show full item record

Collections
  • Project Whirlwind Reports

Browse

All of DomeCommunities & CollectionsBy Issue DateCreatorsTitlesSubjectsThis CollectionBy Issue DateCreatorsTitlesSubjects

My Account

Login
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.