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dc.contributor.authorSmith, Donald O.en_US
dc.date.accessioned2009-06-15T20:32:41Z
dc.date.available2009-06-15T20:32:41Z
dc.date.issued1956-06-04en_US
dc.identifierMC665_r16_M-4362en_US
dc.identifier.urihttp://hdl.handle.net/1721.3/40647
dc.descriptionNote: This report was submitted as a Letter to the Editor for the Physical Review.en_US
dc.description.abstractThe magnetization reversal of thin films (1000 A thick) of 80-20 Permalloy has been studied in a strip transmission line. These films are evaporated onto a heated glass substrate in the presence of an orienting field. Magnetization reversal along the axis of initial orientation takes place in times less than 20 msec in any reversing field large enough to overcome the orienting energy. The switching coefficient Sw is defined by Sw=HmT9, with T the reversal time and Hm the reversal field. The experiment gives Hm-1 oe and Tm<2x10-8 seconds from which Sw <2 x 10-8 oe.-sec. Reversal by rotation of the magnetization as a whole in the plane of the film yields a model which is consistent with the observed reversal times. Preliminary measurements of the initial permeability perpendicular to the orientation axis have been carried out to 2000 mc and do not yet reveal the expected frequency dispersion of the initial permeability. This is an indication that Sw may be another order of magnitude smaller than reported here.en_US
dc.language.isoenen_US
dc.publisherLincoln Laboratory - Division 6en_US
dc.relation.ispartofseriesDivision 6 Memo M-4362en_US
dc.relation.ispartofseriesProject Whirlwind Collection, MC665en_US
dc.titleMagnetization reversal in thin filmsen_US
dc.typeTechnical Reporten_US


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