dc.contributor.author | Watt, C. W. | en_US |
dc.contributor.author | Davis, R. | en_US |
dc.contributor.author | Proehle, E. C. | en_US |
dc.date.accessioned | 2009-06-15T19:40:57Z | |
dc.date.available | 2009-06-15T19:40:57Z | |
dc.date.issued | 1955-08-31 | en_US |
dc.identifier | MC665_r15_M-3855 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.3/40623 | |
dc.description | Includes: definitions; test planning; test plan concurrence; test conduct; and diagram. | en_US |
dc.description.abstract | The logical steps necessary to the planning and execution of
SAGE subsystem and system tests are outlined and the various kinds of these tests are defined. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Lincoln Laboratory - Division 6 | en_US |
dc.relation.ispartofseries | Division 6 Memo M-3855 | en_US |
dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
dc.subject.other | subsystem | en_US |
dc.subject.other | technical planning | en_US |
dc.subject.other | administrative planning | en_US |
dc.subject.other | technical operation | en_US |
dc.title | Test planning, concurrence, and conduct in the SAGE system | en_US |
dc.type | Technical Report | en_US |