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dc.contributor.authorMitchell, J. L.en_US
dc.date.accessioned2009-06-15T19:40:23Z
dc.date.available2009-06-15T19:40:23Z
dc.date.issued1955-02-21en_US
dc.identifierMC665_r15_M-3390en_US
dc.identifier.urihttp://hdl.handle.net/1721.3/40612
dc.descriptionIncludes: a description of the tests and charts.en_US
dc.description.abstractTest margins taken on two 64x64 planes indicate that DCL-2-720 cores are superior to S-1 cores.en_US
dc.language.isoenen_US
dc.publisherLincoln Laboratory - Division 6en_US
dc.relation.ispartofseriesDivision 6 Memo M-3390en_US
dc.relation.ispartofseriesProject Whirlwind Collection, MC665en_US
dc.subject.otherMTC planeen_US
dc.subject.othersense-amplifier bias voltageen_US
dc.subject.otherX and Y currentsen_US
dc.subject.otherstrobe timeen_US
dc.subject.otherbias voltsen_US
dc.subject.otherdriving currentsen_US
dc.titleMemory-plane margins: DCL-2-720 cores vs. S-1 coresen_US
dc.typeTechnical Reporten_US


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