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dc.contributor.authorO'Brien, J. A.en_US
dc.date.accessioned2009-06-15T19:35:20Z
dc.date.available2009-06-15T19:35:20Z
dc.date.issued1955-01-10en_US
dc.identifierMC665_r15_M-3271en_US
dc.identifier.urihttp://hdl.handle.net/1721.3/40516
dc.descriptionLists the objectives of the XD-1 test specifications and the series of tests to be written.en_US
dc.description.abstractDescription of the formation of a section within Group 62 organized to write test specifications for the XD-1 equipment to evaluate its performance.en_US
dc.language.isoenen_US
dc.publisherLincoln Laboratory - Division 6en_US
dc.relation.ispartofseriesDivision 6 Memo M-3271en_US
dc.relation.ispartofseriesProject Whirlwind Collection, MC665en_US
dc.subject.otherequipment reliabilityen_US
dc.subject.otherhistory of voltage marginsen_US
dc.subject.othershock testsen_US
dc.titleXD-1 test specificationsen_US
dc.typeTechnical Reporten_US


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