dc.contributor.author | O'Brien, J. A. | en_US |
dc.date.accessioned | 2009-06-15T19:35:20Z | |
dc.date.available | 2009-06-15T19:35:20Z | |
dc.date.issued | 1955-01-10 | en_US |
dc.identifier | MC665_r15_M-3271 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.3/40516 | |
dc.description | Lists the objectives of the XD-1 test specifications and the series of tests to be written. | en_US |
dc.description.abstract | Description of the formation of a section within Group 62 organized to write test specifications for the XD-1 equipment to evaluate its performance. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Lincoln Laboratory - Division 6 | en_US |
dc.relation.ispartofseries | Division 6 Memo M-3271 | en_US |
dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
dc.subject.other | equipment reliability | en_US |
dc.subject.other | history of voltage margins | en_US |
dc.subject.other | shock tests | en_US |
dc.title | XD-1 test specifications | en_US |
dc.type | Technical Report | en_US |