| dc.contributor.author | Crane, J. D. | en_US |
| dc.date.accessioned | 2009-06-15T19:34:26Z | |
| dc.date.available | 2009-06-15T19:34:26Z | |
| dc.date.issued | 1955-11-01 | en_US |
| dc.identifier | MC665_r15_M-3940 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.3/40499 | |
| dc.description | Includes: introduction; equipment and logical functions submitted for acceptance; results of acceptance test demonstration; XD-1 performance during July, August, and September 1955; margins and margin history; summary; table; and diagrams. | en_US |
| dc.description.abstract | Results of a system test performed on the magnetic tapes and fifteen addressable drum fields. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Lincoln Laboratory - Division 6 | en_US |
| dc.relation.ispartofseries | Division 6 Memo M-3940 | en_US |
| dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
| dc.subject.other | voltage margins | en_US |
| dc.subject.other | core memories | en_US |
| dc.subject.other | card machines | en_US |
| dc.subject.other | performance records | en_US |
| dc.subject.other | demonstration runs | en_US |
| dc.title | Results of the system test (phase II) performed on the AN/FSQ-7 (XD-1) during July, August, and September 1955 | en_US |
| dc.type | Technical Report | en_US |
