| dc.contributor.author | Brown, David R. | en_US |
| dc.date.accessioned | 2009-05-09T05:09:07Z | |
| dc.date.available | 2009-05-09T05:09:07Z | |
| dc.date.issued | 1953-09-22 | en_US |
| dc.identifier | MC665_r06_M-2420.pdf | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.3/39466 | |
| dc.description.abstract | The only tests applied to all cores are those to determine acceptable values of [subscript r]V[subscript 1]. Other tests are made on a sample basis. Since the memory-core-procurement program is on a development basis, but has an inflexible time schedule, modifications of the specifications can be expected. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Lincoln Laboratory - Division 6 | en_US |
| dc.relation.ispartofseries | MIT DIC 6889 | en_US |
| dc.relation.ispartofseries | Project Whirlwind Memo M-2420 | en_US |
| dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
| dc.title | Interpretation of Memory-Core Specifications | en_US |
| dc.type | Technical Report | en_US |
