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dc.contributor.authorEverett, R. R.en_US
dc.contributor.authorHosier, W. A.en_US
dc.date.accessioned2009-05-08T05:21:19Z
dc.date.available2009-05-08T05:21:19Z
dc.date.issued1952-08-22en_US
dc.identifierMC665_r05_M-1611.pdfen_US
dc.identifier.urihttp://hdl.handle.net/1721.3/39335
dc.descriptionPresent: R. Best, J. D. Crane, R. R. Everett, W. A. Hosier, R. Hughes, W. Ogden, K. H. Olsen, W. N. Papian, H. J. Platt, R. Sims, H. Smead, N. H. Taylor, R. von Buelow.en_US
dc.description.abstractDecisions and progress relevant to the proposed Memory Test Computer (MTC) are summarized for distribution to those interested, and to trace development of the computer.en_US
dc.language.isoenen_US
dc.publisherMIT Digital Computer Laboratoryen_US
dc.relation.ispartofseriesMIT DIC 6889en_US
dc.relation.ispartofseriesProject Whirlwind Memo M-1611en_US
dc.relation.ispartofseriesProject Whirlwind Collection, MC665en_US
dc.titleMTC Meeting of August 22, 1952en_US
dc.typeTechnical Reporten_US


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