dc.contributor.author | Everett, R. R. | en_US |
dc.contributor.author | Hosier, W. A. | en_US |
dc.date.accessioned | 2009-05-08T05:20:35Z | |
dc.date.available | 2009-05-08T05:20:35Z | |
dc.date.issued | 1952-07-28 | en_US |
dc.identifier | MC665_r05_M-1566.pdf | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.3/39321 | |
dc.description | Present: R. R. Everett, W. A. Hosier, R. P. Mayer, W. Ogden, K. H. Olsen, W. N. Papian, L. L. Sutro, N. H. Taylor, H. Smead, R. von Buelow. | en_US |
dc.description.abstract | Decisions and progress relevant to the proposed Memory Test Computer (MTC) are summarized for distribution to those interested, and to trace development of the computer. | en_US |
dc.language.iso | en | en_US |
dc.publisher | MIT Digital Computer Laboratory | en_US |
dc.relation.ispartofseries | MIT DIC 6889 | en_US |
dc.relation.ispartofseries | Project Whirlwind Memo M-1566 | en_US |
dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
dc.subject.other | Memory Test Computer | en_US |
dc.subject.other | transistor circuits | en_US |
dc.title | MTC Meeting of July 25, 1952 | en_US |
dc.type | Technical Report | en_US |