| dc.contributor.author | Watt, C. W. | en_US |
| dc.contributor.author | Paine, B. B. | en_US |
| dc.date.accessioned | 2009-05-08T05:20:12Z | |
| dc.date.available | 2009-05-08T05:20:12Z | |
| dc.date.issued | 1952-12-03 | en_US |
| dc.identifier | MC665_r05_M-1740.pdf | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.3/39313 | |
| dc.description.abstract | About one full working day was spent discussing component and production problems with the members of the Vacuum Tube Analysis Lab and with shop personnel. Emphasis was placed on trying to decide what phases of component study should be undertaken first, for maximum mutual benefit. IBM inspection and test techniques were studied. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | MIT Digital Computer Laboratory | en_US |
| dc.relation.ispartofseries | MIT DIC 6889 | en_US |
| dc.relation.ispartofseries | Project Whirlwind Memo M-1740 | en_US |
| dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
| dc.title | Visit to IBM, Poughkeepsie, New York | en_US |
| dc.type | Technical Report | en_US |
