| dc.contributor.author | Forrester, Jay W. | en_US |
| dc.date.accessioned | 2009-05-08T05:14:51Z | |
| dc.date.available | 2009-05-08T05:14:51Z | |
| dc.date.issued | 1953-01-27 | en_US |
| dc.identifier | MC665_r05_M-1828.pdf | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.3/39200 | |
| dc.description.abstract | A detailed laboratory test of circuits should be made to measure the operating margins and the sensitivity of the circuit to component changes. Also a measurement of marginal checking effectiveness is needed. A curve of component variation vs. marginal checking voltage (or other parameter) will reveal behavior of the circuit. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | MIT Digital Computer Laboratory | en_US |
| dc.relation.ispartofseries | MIT DIC 6889 | en_US |
| dc.relation.ispartofseries | Project Whirlwind Memo M-1828 | en_US |
| dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
| dc.title | Design and Tests of Electronic Circuits for Operating Safety Margins | en_US |
| dc.type | Technical Report | en_US |
