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dc.contributor.authorForrester, Jay W.en_US
dc.date.accessioned2009-05-08T05:14:51Z
dc.date.available2009-05-08T05:14:51Z
dc.date.issued1953-01-27en_US
dc.identifierMC665_r05_M-1828.pdfen_US
dc.identifier.urihttp://hdl.handle.net/1721.3/39200
dc.description.abstractA detailed laboratory test of circuits should be made to measure the operating margins and the sensitivity of the circuit to component changes. Also a measurement of marginal checking effectiveness is needed. A curve of component variation vs. marginal checking voltage (or other parameter) will reveal behavior of the circuit.en_US
dc.language.isoenen_US
dc.publisherMIT Digital Computer Laboratoryen_US
dc.relation.ispartofseriesMIT DIC 6889en_US
dc.relation.ispartofseriesProject Whirlwind Memo M-1828en_US
dc.relation.ispartofseriesProject Whirlwind Collection, MC665en_US
dc.titleDesign and Tests of Electronic Circuits for Operating Safety Marginsen_US
dc.typeTechnical Reporten_US


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