| dc.contributor.author | Fine, S. | en_US |
| dc.date.accessioned | 2009-05-04T21:30:12Z | |
| dc.date.available | 2009-05-04T21:30:12Z | |
| dc.date.issued | 1953-03-06 | en_US |
| dc.identifier | MC665_r04_E-531.pdf | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.3/38936 | |
| dc.description.abstract | The sources of noise in an array consist of inductive and capacitive coupling between driving lines and sensing winding, the outputs of half-selected cores and the differences in magnetic properties of the cores. The margins on driving currents are determined by these factors. The lower current limit is dependent mainly on the amplitude of disturbed-ONE and the upper limit by the amplitude of disturbed-ZERO and the half-selected outputs. Experimental results check the validity of a derived equation for determining current margins. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | MIT Digital Computer Laboratory | en_US |
| dc.relation.ispartofseries | MIT DIC 6889 | en_US |
| dc.relation.ispartofseries | Project Whirlwind Engineering Note E-531 | en_US |
| dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
| dc.title | Driving Current Margins on Memory Test Setup I | en_US |
| dc.type | Technical Report | en_US |
