Now showing items 1-3 of 3

    • MTC Accumulator Test 

      Anderson, Harlan E. (MIT Digital Computer Laboratory, 1953-03-10)
      A high speed self checking test was used to test the MTC accumulator. Every gate tube and buffer tube was tested at a time when it should pass a pulse and at a time when it should not pass a pulse. Marginal checking of ...
    • MTC Tests on Magnetic Memory - Automatic Memory Display 

      Anderson, Harlan E. (MIT Digital Computer Laboratory, 1953-05-05)
      This is the first of a series of M-notes describing procedures, programs, and results of MTC tests on the magnetic memory. Automatic memory display is a simple test procedure for reading, rewriting, and displaying the ...
    • Preliminary MTC System Test 

      Anderson, Harlan E. (MIT Digital Computer Laboratory, 1953-03-06)
      A preliminary test of MTC, using about half of the computer, was performed. The arithmetic element and output scope displays were tested by a fixed program which generated sines and cosines and displayed them.