| dc.contributor.author | Nottingham, Wayne B. (Wayne Buckles), 1899- | |
| dc.date.accessioned | 2024-06-25T22:13:29Z | |
| dc.date.available | 2024-06-25T22:13:29Z | |
| dc.identifier.uri | http://hdl.handle.net/1721.3/204514 | |
| dc.description | For more information about this item, visit https://archivesspace.mit.edu/repositories/2/archival_objects/458307 | en_US |
| dc.rights | This item may be under copyright. Please consult the collection finding aid or catalog record and the MIT Libraries Permissions Policy for more information. | en_US |
| dc.rights.uri | https://rightsstatements.org/page/CNE/1.0/ | |
| dc.title | "A Detailed Examination of the Principles of Ion Gauge Calibration" by Wayne B. Nottingham et al. MIT Research Laboratory of Electronics, Technical Report 379 | en_US |
