Digital Collections is now live following our recent platform upgrade and migration. We'll continue making improvements over the coming weeks as we complete post-launch enhancements. If you spot something unexpected or experience an issue, please let us know by emailing dspace-lib@mit.edu.

Evaluation tests on the XD-1 central computer

File / Documentation
Name

MC665_r15_M-3317.pdf

Size

944.3 KB

Format

Adobe PDF

Checksum (MD5)

0bf1d08fe251a79009dc470163b87bb9

Creator(s)
Canty, W. J.
Crane, J. D.
Thompson, S. L.
Date
1955-01-21
Description
Includes: introduction and outline of tests.
This memorandum represents an expansion of 6M-3271 "XD-1 Test Specifications,"
by J. A. O'Brien, dated 7 January 1955.
Series
Division 6 Memo M-3317
Project Whirlwind Collection, MC665
Type
Technical Report
Language
English
Persistent Link