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Test planning, concurrence, and conduct in the SAGE system

File / Documentation
Name

MC665_r15_M-3855.pdf

Size

1.35 MB

Format

Adobe PDF

Checksum (MD5)

bc97b7f2aab7457e7c4e53e746771a3f

Creator(s)
Watt, C. W.
Davis, R.
Proehle, E. C.
Date
1955-08-31
Description
Includes: definitions; test planning; test plan concurrence; test conduct; and diagram.
Series
Division 6 Memo M-3855
Project Whirlwind Collection, MC665
Type
Technical Report
Language
English
Persistent Link