dc.contributor.author | Crane, J. D. | en_US |
dc.contributor.author | Thompson, S. L. | en_US |
dc.date.accessioned | 2009-06-15T19:35:59Z | |
dc.date.available | 2009-06-15T19:35:59Z | |
dc.date.issued | 1955-06-08 | en_US |
dc.identifier | MC665_r15_M-3669 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.3/40528 | |
dc.description | Includes: physical and logical state of XD-1; reliability; log book data; log book analysis table; XD-1 failures table; MIT's assigned time on XD-1 table; evaluation test; computer evaluation test table; reliability analysis; margins and margin history; table of exceptions; shock tests; and conclusions. | en_US |
dc.description.abstract | The CD side of the drums was systems tested and was
now part of the XD-1. However, as anticipated by the drum system engineers, the drums performed very poorly during the evaluation tests. The percentage of usable assigned time was 73% during the time assigned to MIT and 74.5% for the time during which IBM was running reliability programs and utility
programs. Most of the low margins found during the last evaluation were improved. In general, the reliability of the central computer had improved slightly since the last evaluation made. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Lincoln Laboratory - Division 6 | en_US |
dc.relation.ispartofseries | Division 6 Memo M-3669 | en_US |
dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
dc.subject.other | magnetic tape equipment | en_US |
dc.subject.other | drum systems | en_US |
dc.subject.other | magnetic cores | en_US |
dc.subject.other | marginal checking | en_US |
dc.subject.other | plug-in units | en_US |
dc.subject.other | card machines | en_US |
dc.subject.other | Burroughs' gate | en_US |
dc.subject.other | delay unit | en_US |
dc.subject.other | program element | en_US |
dc.subject.other | control element | en_US |
dc.subject.other | arithmetic element | en_US |
dc.subject.other | core memories | en_US |
dc.title | XD-1 evaluation, 20 May 1955 | en_US |
dc.type | Technical Report | en_US |