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dc.contributor.authorCrane, J. D.en_US
dc.contributor.authorThompson, S. L.en_US
dc.date.accessioned2009-06-15T19:35:59Z
dc.date.available2009-06-15T19:35:59Z
dc.date.issued1955-06-08en_US
dc.identifierMC665_r15_M-3669en_US
dc.identifier.urihttp://hdl.handle.net/1721.3/40528
dc.descriptionIncludes: physical and logical state of XD-1; reliability; log book data; log book analysis table; XD-1 failures table; MIT's assigned time on XD-1 table; evaluation test; computer evaluation test table; reliability analysis; margins and margin history; table of exceptions; shock tests; and conclusions.en_US
dc.description.abstractThe CD side of the drums was systems tested and was now part of the XD-1. However, as anticipated by the drum system engineers, the drums performed very poorly during the evaluation tests. The percentage of usable assigned time was 73% during the time assigned to MIT and 74.5% for the time during which IBM was running reliability programs and utility programs. Most of the low margins found during the last evaluation were improved. In general, the reliability of the central computer had improved slightly since the last evaluation made.en_US
dc.language.isoenen_US
dc.publisherLincoln Laboratory - Division 6en_US
dc.relation.ispartofseriesDivision 6 Memo M-3669en_US
dc.relation.ispartofseriesProject Whirlwind Collection, MC665en_US
dc.subject.othermagnetic tape equipmenten_US
dc.subject.otherdrum systemsen_US
dc.subject.othermagnetic coresen_US
dc.subject.othermarginal checkingen_US
dc.subject.otherplug-in unitsen_US
dc.subject.othercard machinesen_US
dc.subject.otherBurroughs' gateen_US
dc.subject.otherdelay uniten_US
dc.subject.otherprogram elementen_US
dc.subject.othercontrol elementen_US
dc.subject.otherarithmetic elementen_US
dc.subject.othercore memoriesen_US
dc.titleXD-1 evaluation, 20 May 1955en_US
dc.typeTechnical Reporten_US


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