dc.contributor.author | Menyuk, Norman | en_US |
dc.date.accessioned | 2009-06-12T22:14:06Z | |
dc.date.available | 2009-06-12T22:14:06Z | |
dc.date.issued | 1954-05-03 | en_US |
dc.identifier | MC665_r13_M-2804 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.3/40355 | |
dc.description.abstract | Measurements of the flux reversal time t have been made for 1/8-mil, 1/4-mil, 1/2-mil, and 1-mil 4-79 Molybdenum-Permalloy tape cores as a function of the applied field. These measurements were taken at seven different temperatures, ranging from -196ºC. to 270ºC. From these measurements, the switching coefficient S[subscript W] = (H - H[subscript O] t is found. Determination of the switching coefficient as a function of tape thickness is shown to permit a separation of the spin-relaxation and eddy-current contribution to switching delay. These contributions are studied individually as functions of temperature. Upon increasing the temperature over the range considered, the eddy-current contribution and the threshold field value H[subscript O] are approximately halved while the spin-relaxation contribution is reduced by 20%. All these factors lead to a faster flux reversal at higher temperatures. This behavior is show to be in agreement with theoretical predictions. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Lincoln Laboratory - Division 6 | en_US |
dc.relation.ispartofseries | MIT DIC 6889 | en_US |
dc.relation.ispartofseries | Project Whirlwind Memo M-2804 | en_US |
dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
dc.title | Effects of Tape Thickness and Temperature on Flux Reversal of 4-79 Molybdenum-Permalloy | en_US |
dc.type | Technical Report | en_US |