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dc.contributor.authorMenyuk, Normanen_US
dc.date.accessioned2009-06-12T22:14:06Z
dc.date.available2009-06-12T22:14:06Z
dc.date.issued1954-05-03en_US
dc.identifierMC665_r13_M-2804en_US
dc.identifier.urihttp://hdl.handle.net/1721.3/40355
dc.description.abstractMeasurements of the flux reversal time t have been made for 1/8-mil, 1/4-mil, 1/2-mil, and 1-mil 4-79 Molybdenum-Permalloy tape cores as a function of the applied field. These measurements were taken at seven different temperatures, ranging from -196ºC. to 270ºC. From these measurements, the switching coefficient S[subscript W] = (H - H[subscript O] t is found. Determination of the switching coefficient as a function of tape thickness is shown to permit a separation of the spin-relaxation and eddy-current contribution to switching delay. These contributions are studied individually as functions of temperature. Upon increasing the temperature over the range considered, the eddy-current contribution and the threshold field value H[subscript O] are approximately halved while the spin-relaxation contribution is reduced by 20%. All these factors lead to a faster flux reversal at higher temperatures. This behavior is show to be in agreement with theoretical predictions.en_US
dc.language.isoenen_US
dc.publisherLincoln Laboratory - Division 6en_US
dc.relation.ispartofseriesMIT DIC 6889en_US
dc.relation.ispartofseriesProject Whirlwind Memo M-2804en_US
dc.relation.ispartofseriesProject Whirlwind Collection, MC665en_US
dc.titleEffects of Tape Thickness and Temperature on Flux Reversal of 4-79 Molybdenum-Permalloyen_US
dc.typeTechnical Reporten_US


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