dc.contributor.author | Hughes, Arthur D. | en_US |
dc.date.accessioned | 2009-05-08T05:21:35Z | |
dc.date.available | 2009-05-08T05:21:35Z | |
dc.date.issued | 1953-01-07 | en_US |
dc.identifier | MC665_r05_M-1785.pdf | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.3/39340 | |
dc.description.abstract | Of 668 metallic cores tested, 38.8 percent were selected as good cores. The specification for a good core were: (1) an absence of disturb sensitivity,* (2) a switching time of 7.6 to 9.3 microseconds and (3) a disturbed-one voltage of 30 to 38 millivolts. Recommendations for future tests are made as follows: (1) obtain continuous calibration of oscilloscope and pre-amp with a standard known waveform superimposed on test scope screen; (2) obtain continuous calibration of driving current with a small current calibrator; (3) test cores in batches of approximately 24, tagging each batch and numbering cores in a predefined manner, eliminating color coding. | en_US |
dc.language.iso | en | en_US |
dc.publisher | MIT Digital Computer Laboratory | en_US |
dc.relation.ispartofseries | MIT DIC 6889 | en_US |
dc.relation.ispartofseries | Project Whirlwind Memo M-1785 | en_US |
dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
dc.title | Testing of Metallic Cores | en_US |
dc.type | Technical Report | en_US |