Show simple item record

dc.contributor.authorHughes, Arthur D.en_US
dc.date.accessioned2009-05-08T05:21:35Z
dc.date.available2009-05-08T05:21:35Z
dc.date.issued1953-01-07en_US
dc.identifierMC665_r05_M-1785.pdfen_US
dc.identifier.urihttp://hdl.handle.net/1721.3/39340
dc.description.abstractOf 668 metallic cores tested, 38.8 percent were selected as good cores. The specification for a good core were: (1) an absence of disturb sensitivity,* (2) a switching time of 7.6 to 9.3 microseconds and (3) a disturbed-one voltage of 30 to 38 millivolts. Recommendations for future tests are made as follows: (1) obtain continuous calibration of oscilloscope and pre-amp with a standard known waveform superimposed on test scope screen; (2) obtain continuous calibration of driving current with a small current calibrator; (3) test cores in batches of approximately 24, tagging each batch and numbering cores in a predefined manner, eliminating color coding.en_US
dc.language.isoenen_US
dc.publisherMIT Digital Computer Laboratoryen_US
dc.relation.ispartofseriesMIT DIC 6889en_US
dc.relation.ispartofseriesProject Whirlwind Memo M-1785en_US
dc.relation.ispartofseriesProject Whirlwind Collection, MC665en_US
dc.titleTesting of Metallic Coresen_US
dc.typeTechnical Reporten_US


Files in this item

This item appears in the following Collection(s)

Show simple item record