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dc.contributor.authorAnderson, Harlan E.en_US
dc.date.accessioned2009-05-08T05:16:41Z
dc.date.available2009-05-08T05:16:41Z
dc.date.issued1953-03-10en_US
dc.identifierMC665_r05_M-1887.pdfen_US
dc.identifier.urihttp://hdl.handle.net/1721.3/39239
dc.description.abstractA high speed self checking test was used to test the MTC accumulator. Every gate tube and buffer tube was tested at a time when it should pass a pulse and at a time when it should not pass a pulse. Marginal checking of this test indicated that the accumulator had satisfactory margins throughout.en_US
dc.language.isoenen_US
dc.publisherMIT Digital Computer Laboratoryen_US
dc.relation.ispartofseriesMIT DIC 6889en_US
dc.relation.ispartofseriesProject Whirlwind Memo M-1887en_US
dc.relation.ispartofseriesProject Whirlwind Collection, MC665en_US
dc.titleMTC Accumulator Testen_US
dc.typeTechnical Reporten_US


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