dc.contributor.author | Anderson, Harlan E. | en_US |
dc.date.accessioned | 2009-05-08T05:16:41Z | |
dc.date.available | 2009-05-08T05:16:41Z | |
dc.date.issued | 1953-03-10 | en_US |
dc.identifier | MC665_r05_M-1887.pdf | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.3/39239 | |
dc.description.abstract | A high speed self checking test was used to test the MTC accumulator. Every gate tube and buffer tube was tested at a time when it should pass a pulse and at a time when it should not pass a pulse. Marginal checking of this test indicated that the accumulator had satisfactory margins throughout. | en_US |
dc.language.iso | en | en_US |
dc.publisher | MIT Digital Computer Laboratory | en_US |
dc.relation.ispartofseries | MIT DIC 6889 | en_US |
dc.relation.ispartofseries | Project Whirlwind Memo M-1887 | en_US |
dc.relation.ispartofseries | Project Whirlwind Collection, MC665 | en_US |
dc.title | MTC Accumulator Test | en_US |
dc.type | Technical Report | en_US |