Show simple item record

dc.contributor.authorBrown, David R.en_US
dc.date.accessioned2009-05-04T21:32:17Z
dc.date.available2009-05-04T21:32:17Z
dc.date.issued1952-07-17en_US
dc.identifierMC665_r04_E-464.pdfen_US
dc.identifier.urihttp://hdl.handle.net/1721.3/38970
dc.description.abstractA quantitative index of hysteresis-loop squareness i s defined. It can be determined directly from the hysteresis loop or by pulse test.en_US
dc.language.isoenen_US
dc.publisherMIT Digital Computer Laboratoryen_US
dc.relation.ispartofseriesMIT DIC 6889en_US
dc.relation.ispartofseriesProject Whirlwind Engineering Note E-464en_US
dc.relation.ispartofseriesProject Whirlwind Collection, MC665en_US
dc.titleA Squareness Ratio for Coincident-current Memory Coresen_US
dc.typeTechnical Reporten_US


Files in this item

This item appears in the following Collection(s)

Show simple item record