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Memory core heating by switching at high frequencies
(Lincoln Laboratory - Division 6, 1956-01-31)
The heating of a memory core caused by high frequency
switching has been studied experimentally. For a
switching frequency of 4OO kilocycles (the maximum frequency possible in a coincident-current two-to-one
selection ...
The noise problem in the coincident-current memory matrix
(Lincoln Laboratory - Division 6, 1956-02-13)
Magnetic ferrites which have square hysteresis loops are being used as memory elements in high-speed digital computers. The limiting
factor in memory reliability is the noise generated by the magnetic cores which are ...
Core Drivers - Model V and Model VI Applications, Limitations, and Modifications
(Lincoln Laboratory - Division 6, 1954-04-01)
(This memorandum supersedes Engineering Note E-523.¹) The Model V and Model VI Core Drivers are standard test units which generate rectangular wave current pulses of variable amplitude, rise time, and duration. Model V ...